BENGALURU, India — ARM has set up a VLSI test lab at its design center here to analyze intellectual-property libraries and ARM physical IP, so as to correlate design to silicon behavior. Such activity ...

Power consumption has become a crucial concern in Built-In Self-Test (BIST) due to the switching activity in the Circuit Under-Test (CUT). In this paper, the authors present a novel method which aims ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

The IEEE's Test Technology Technical Council (TTTC) has extended the deadline for paper submissions for the 2003 IEEE VLSI Test Symposium, slated for April 27 to May 1 in Napa Valley, CA. Paper ...

Description: Discusses different aspects of VLSI testing and formal verification of designs. Design and manufacturing defect models are introduced along with test generation and fault simulation ...

Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes.